THE ADVANCED PHOTON SOURCE-X-RAY TRANSMITTING BEAM-POSITION-MONITOR TESTS AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE X-25 BEAMLINE

被引：10
|
作者：
SHU, D
COLLINS, JT
BARRAZA, J
KUZAY, TM
机构：
[1] Experimental Facilities Division, Advanced Photon Source, Argonne National Laboratory, Argonne
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 347卷 / 1-3期
关键词：
D O I：
10.1016/0168-9002(94)91951-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A synthetic-diamond-based X-ray transmitting beam-position monitor has been studied using focused white beam at the National Synchrotron Light Source X-25 wiggler beamline. of particular interest are the possibilities to design an integral window and filter/photon beam-position monitor for the Advanced Photon Source high-heat-flux insertion-device beamlines. The preliminary measurements were taken using two synthetic-diamond blade samples with different thicknesses and cooling configurations. The monitor (consisting of a vacuum vessel, an ion pump, a water-cooling base, a blade mounting block, and electric feedthroughs) was mounted on a three-dimensional (x, y, phi) stepping-motor-driven stage with a 0.064-mum stepping size and a 0.1-mum linear encoder resolution. An infrared camera system was used to monitor and record the diamond blade surface temperature field through a sapphire window and test results are presented.
引用
收藏
页码：577 / 580
页数：4
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