ERROR IN RECORDING THE DISTRIBUTION OF PARAMETERS OF SEMICONDUCTOR-MATERIALS

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作者：

YUROVA, ES

KARTAVYKH, AV

KOVARSKII, VY

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来源：

INDUSTRIAL LABORATORY | 1990年 / 56卷 / 03期

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中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

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页码：290 / 292

页数：3

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