DEPENDENCE OF INTERFACE WIDTHS ON ION-BOMBARDMENT CONDITIONS IN SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF A NICKEL CHROMIUM MULTILAYER STRUCTURE

被引：29

作者：

MOENS, M

ADAMS, FC

SIMONS, DS

机构：

[1] UNIV INSTELLING ANTWERP,DEPT CHEM,UNIV SPLEIN 1,B-2610 WILRIJK,BELGIUM

[2] NBS,CTR ANALYT CHEM,GAITHERSBURG,MD 20899

来源：

ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 11期

关键词：

D O I：

10.1021/ac00138a009

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1518 / 1529

页数：12

共 50 条

[31] TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRIC ANALYSIS OF POLYMER SURFACES AND ADDITIVES
LINTON, RW
MAWN, MP
BELU, AM
DESIMONE, JM
HUNT, MO
MENCELOGLU, YZ
CRAMER, HG
BENNINGHOVEN, A
SURFACE AND INTERFACE ANALYSIS, 1993, 20 (12) : 991 - 999
[32] EVALUATION OF LOCAL THERMAL-EQUILIBRIUM MODEL FOR QUANTITATIVE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS
SIMONS, DS
BAKER, JE
EVANS, CA
ANALYTICAL CHEMISTRY, 1976, 48 (09) : 1341 - 1348
[33] CONDITIONS OF THE MINIMUM SOLID-SURFACE STRUCTURE RUPTURE DURING ION-BOMBARDMENT
GRUICH, DD
PICHKO, SV
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1985, 49 (09): : 1804 - 1807
[34] POSITIVE-ION FAST-ATOM-BOMBARDMENT MASS-SPECTROMETRIC ANALYSIS OF THE MOLECULAR-SPECIES OF GLYCEROPHOSPHATIDYLSERINE
CHEN, S
KIRSCHNER, G
TRALDI, P
ANALYTICAL BIOCHEMISTRY, 1990, 191 (01) : 100 - 105
[35] SECONDARY ION MASS-SPECTROMETRIC STUDIES OF HYDROGEN IN HIGH-STRENGTH STEELS
SASTRI, VS
CIM BULLETIN, 1988, 81 (914): : 80 - 80
[36] SECONDARY ION MASS-SPECTROMETRIC STUDY OF DISSOLVED SILVER AND INDIUM IN SULFIDE MINERALS
MCINTYRE, NS
CABRI, LJ
CHAUVIN, WJ
LAFLAMME, JHG
SCANNING ELECTRON MICROSCOPY, 1984, : 1139 - 1146
[37] ELEMENT PARTITIONING BETWEEN MAJORITE AND LIQUID - A SECONDARY ION MASS-SPECTROMETRIC STUDY
YURIMOTO, H
OHTANI, E
GEOPHYSICAL RESEARCH LETTERS, 1992, 19 (01) : 17 - 20
[38] ON THE ROLE OF A DEFECT FLUX ON THE REDISTRIBUTION OF SILVER ATOMS IN SILVER NICKEL MULTILAYER FILMS UNDER ION-BOMBARDMENT
CRETTI, S
KOTHARI, DC
MIOTELLO, A
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 133 (01): : 25 - 31
[39] CHARGING EFFECTS IN THE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF TARGETS CONTAINING LOW-CONDUCTIVITY REGIONS
REUTER, W
YU, ML
FRISCH, MA
SMALL, MB
JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 850 - 855
[40] RELATIVE SENSITIVITY FACTORS OF ELEMENTS IN QUANTITATIVE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF BIOLOGICAL REFERENCE MATERIALS
RAMSEYER, GO
MORRISON, GH
ANALYTICAL CHEMISTRY, 1983, 55 (12) : 1963 - 1970

← 1 2 3 4 5 →