DEPENDENCE OF INTERFACE WIDTHS ON ION-BOMBARDMENT CONDITIONS IN SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF A NICKEL CHROMIUM MULTILAYER STRUCTURE

被引：29
|
作者：
MOENS, M
ADAMS, FC
SIMONS, DS
机构：
[1] UNIV INSTELLING ANTWERP,DEPT CHEM,UNIV SPLEIN 1,B-2610 WILRIJK,BELGIUM
[2] NBS,CTR ANALYT CHEM,GAITHERSBURG,MD 20899
来源：
ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 11期
关键词：
D O I：
10.1021/ac00138a009
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：1518 / 1529
页数：12
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