DETERMINATION OF TRUE INTENSITY AND POSITION OF X-RAY LINES IN X-RAY DIFFRACTION DIAGRAMS (EXCHANGE OF EXPERIENCE)

被引：0

|

作者：

BAIKOV, AM

LANDA, VA

机构：

来源：

INDUSTRIAL LABORATORY | 1968年 / 34卷 / 09期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1322 / &

相关论文

共 50 条

[31] ON THE X-RAY OR NEUTRON-DIFFRACTION DETERMINATION OF ATOMIC POSITION PARAMETERS
MAIR, SL
WILKINS, SW
ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (MAR): : 264 - 266
[32] The effect of sample position on the determination of triaxial stress by X-ray diffraction
Fenn, R.H.
Jones, A.M.
Journal of Applied Crystallography, 1988, 21 (01): : 38 - 41
[33] X-ray diffraction III: Pharmaceutical applications of x-ray powder diffraction
Brittain, HG
SPECTROSCOPY, 2001, 16 (07) : 14 - +
[34] X-ray Diffraction III Pharmaceutical Applications of X-ray Powder Diffraction
Brittain, Harry G.
1600, Advanstar Communications (25):
[35] Determination of multiwavelength anomalous diffraction coefficients at high x-ray intensity
Son, Sang-Kil
Chapman, Henry N.
Santra, Robin
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2013, 46 (16)
[36] COUNTER DIFFRACTOMETER - EFFECT OF SPECIMEN TRANSPARENCY ON INTENSITY, POSITION AND BREADTH OF X-RAY POWDER DIFFRACTION LINES
LANGFORD, JI
WILSON, AJC
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1962, 39 (12): : 581 - &
[37] Determination of nanoparticle sizes by X-ray diffraction
G. A. Dorofeev
A. N. Streletskii
I. V. Povstugar
A. V. Protasov
E. P. Elsukov
Colloid Journal, 2012, 74 : 675 - 685
[38] THE DETERMINATION OF X-RAY DIFFRACTION LINE WIDTHS
SHULL, CG
PHYSICAL REVIEW, 1946, 70 (9-10): : 679 - 684
[39] QUANTITATIVE DETERMINATION OF KAOLINITE BY X-RAY DIFFRACTION
BRINDLEY, GW
KURTOSSY, SS
AMERICAN MINERALOGIST, 1962, 47 (9-10) : 1213 - &
[40] QUANTITATIVE DETERMINATION OF KAOLINITE BY X-RAY DIFFRACTION
BRINDLEY, GW
KURTOSSY, SS
AMERICAN MINERALOGIST, 1961, 46 (11-2) : 1205 - 1215

← 1 2 3 4 5 →