ACCURATE MICROCRYSTALLOGRAPHY AT HIGH SPATIAL-RESOLUTION USING ELECTRON BACKSCATTERING PATTERNS IN A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE

被引：62
|
作者：
HARLAND, CJ
AKHTER, P
VENABLES, JA
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 02期
关键词：
D O I：
10.1088/0022-3735/14/2/011
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：175 / 182
页数：8
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