DETERMINATION OF OMEGA-GAMMA USING THE TILT OF THE PROPAGATION PLANE

被引：1
|
作者：
SANCHEZ, HJ
RUBIO, M
机构：
[1] Facultad de Matemática, Universidad Nacional de Córdoba, Córdoba, 5000
来源：
X-RAY SPECTROMETRY | 1993年 / 22卷 / 02期
关键词：
D O I：
10.1002/xrs.1300220207
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The product of fluorescence yield (omega) and emission probability (GAMMA), was measured using a method based on the propagation plane inclination. Measurements of the Kalpha line of elements such as Cr, Fe and Ni on binary samples were carried out to determine the product omegaGAMMA. The results were compared with those reported in well known compilations. The proposed procedure can be considered a new alternative to increase the available set of methods for measurin fundamental
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收藏
页码：89 / 91
页数：3
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