SURFACE-ANALYSIS FOR THE CHARACTERIZATION OF DEFECTS IN THIN-FILM PROCESSES

被引：0
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作者：
LALEZARI, R
KNOLLENBERG, RG
机构：
来源：
SURFACE CHARACTERIZATION AND TESTING II | 1989年 / 1164卷
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暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：222 / 235
页数：14
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