MICROPLASMA NOISE IN AVALANCHE PHOTO-DIODES FOR VARIABLE LOW-FREQUENCY DISPLACEMENT

被引:0
|
作者
KAMENETSKAYA, MS
MANSUROV, AN
MARENICH, AS
SHADRIN, GA
机构
来源
RADIOTEKHNIKA I ELEKTRONIKA | 1978年 / 23卷 / 03期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:664 / 667
页数:4
相关论文
共 50 条
  • [31] DARK CURRENT NOISE CHARACTERISTICS AND THEIR TEMPERATURE-DEPENDENCE IN GERMANIUM AVALANCHE PHOTO-DIODES
    KANBE, H
    GROSSKOPF, G
    MIKAMI, O
    MACHIDA, S
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (08) : 1534 - 1539
  • [32] OPTICAL FIBERS AND AVALANCHE PHOTO-DIODES FOR SCINTILLATOR COUNTERS
    BORENSTEIN, SR
    PALMER, RB
    STRAND, RC
    PHYSICA SCRIPTA, 1981, 23 (04): : 550 - 555
  • [33] LONG-WAVELENGTH INGAASP AVALANCHE PHOTO-DIODES
    YEATS, R
    CHIAO, SH
    APPLIED PHYSICS LETTERS, 1979, 34 (09) : 581 - 583
  • [34] OBSERVATION OF THE RESPONSE OF AVALANCHE PHOTO-DIODES TO SCINTILLATOR LIGHT
    STRAND, RC
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (01): : 35 - 35
  • [35] HOT CARRIER STUDY ON HETEROSTRUCTURE AVALANCHE PHOTO-DIODES
    TAKANASHI, Y
    HORIKOSHI, Y
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1982, (63): : 263 - 268
  • [36] LOW-FREQUENCY NOISE IN BACKWARD DIODES
    KORABLEV, IV
    POTEMKIN, VV
    YUNOSOV, F
    RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1968, 13 (04): : 605 - +
  • [37] GERMANIUM AVALANCHE PHOTO-DIODES FOR OPTICAL COMMUNICATION-SYSTEMS
    MIKAWA, T
    KAGAWA, S
    KANEDA, T
    FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1980, 16 (02): : 95 - 118
  • [38] Low-frequency Noise in GaN Diodes
    Leung, K. K.
    Fong, W. K.
    Surya, C.
    2011 21ST INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF), 2011, : 291 - 296
  • [39] TUNNELING IN THE REVERSE DARK CURRENT OF GAALASSB AVALANCHE PHOTO-DIODES
    TABATABAIE, N
    STILLMAN, GE
    CHIN, R
    DAPKUS, PD
    APPLIED PHYSICS LETTERS, 1982, 40 (05) : 415 - 417
  • [40] 1.22-MU-MHGCDTE/CDTE AVALANCHE PHOTO-DIODES
    SHIN, SH
    PASKO, JG
    LAW, HD
    CHEUNG, DT
    APPLIED PHYSICS LETTERS, 1982, 40 (11) : 965 - 967