TOTAL INTERNAL-REFLECTION MICROSCOPY - A SURFACE INSPECTION TECHNIQUE

被引：91

作者：

TEMPLE, PA

机构：

来源：

APPLIED OPTICS | 1981年 / 20卷 / 15期

关键词：

D O I：

10.1364/AO.20.002656

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2656 / 2664

页数：9

共 50 条

[41] SOLAR CONCENTRATORS USING TOTAL INTERNAL-REFLECTION
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[43] PRISMS WITH TOTAL INTERNAL-REFLECTION AS SOLAR REFLECTORS
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[44] DISTORTION OF ULTRASHORT PULSES ON TOTAL INTERNAL-REFLECTION
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[45] IMAGE OF A SLIT SEEN IN TOTAL INTERNAL-REFLECTION
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[47] NONLINEAR TOTAL INTERNAL-REFLECTION IN NEMATIC LAYERS
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[50] TOTAL INTERNAL-REFLECTION RAMAN-SPECTROSCOPY
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