SHOT NOISE BEHAVIOR OF SUB-THRESHOLD MOS-TRANSISTORS

被引：13

|

作者：

FELLRATH, J

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1978年 / 13卷 / 12期

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D O I：

10.1051/rphysap:019780013012071900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：719 / 723

页数：5

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