SEMICONDUCTOR STRUCTURE INVESTIGATION BY THE METHODS OF ACOUSTIC AND ELECTRON THERMOACOUSTIC MICROSCOPY

被引:0
|
作者
GULIAEV, IV
KULAKOV, MA
MOROZOV, AI
RAU, EI
机构
来源
DOKLADY AKADEMII NAUK SSSR | 1988年 / 301卷 / 04期
关键词
D O I
暂无
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:849 / &
相关论文
共 50 条
  • [41] ELECTRON MICROSCOPY INVESTIGATION OF STRUCTURE OF CYTOPLASMIC RIBOSOMES OF BEAN LEAVES
    BRUSKOV, VI
    KISELEV, NA
    JOURNAL OF MOLECULAR BIOLOGY, 1968, 38 (03) : 443 - &
  • [42] INVESTIGATION OF THE STRUCTURE OF IRON CHROMIUM ALLOYS BY COLOR MICROSCOPY METHODS
    ZAITSEVA, LP
    POROKHOVA, TG
    MANVELOVA, KV
    INDUSTRIAL LABORATORY, 1962, 28 (07): : 859 - 864
  • [43] Revealing the Structure/Property Relationships of Semiconductor Nanomaterials via Transmission Electron Microscopy
    Zhao, Peili
    Cheng, Yongfa
    Li, Lei
    Jia, Shuangfeng
    Guan, Xiaoxi
    Huang, Tianlong
    Li, Luying
    Zheng, He
    Wang, Jianbo
    ADVANCED FUNCTIONAL MATERIALS, 2025, 35 (01)
  • [44] Transmission electron microscopy of semiconductor interfaces
    Fung, K.K.
    Proceedings of the Asia Pacific Physics Conference, 1988,
  • [45] Electron microscopy applications to semiconductor devices
    Cunningham, B
    Joseph, TW
    Gignac, L
    Domenicucci, A
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1995, 1995, 146 : 565 - 574
  • [46] Electron microscopy of nanostructured semiconductor materials
    Neumann, W
    MATERIALS CHEMISTRY AND PHYSICS, 2003, 81 (2-3) : 364 - 367
  • [47] PREPARATION OF SEMICONDUCTOR DEVICES FOR SCANNING ELECTRON MICROSCOPY AND QUANTIFICATION USING ETCHBACK METHODS.
    Belcher, R.W.
    Hart, G.P.
    Wade, W.R.
    Scanning Electron Microscopy, 1984, v : 613 - 624
  • [48] Electron spectroscopy and electron microscopy of semiconductor thin films
    Fitzgerald, AG
    ELECTRON MICROSCOPY AND ANALYSIS 2001, 2001, (168): : 331 - 336
  • [49] ACOUSTIC AND ELECTRON-MICROSCOPY STUDY OF THE DISLOCATION-STRUCTURE IN MGO CRYSTALS
    KARDASHEV, BK
    KUSTOV, SB
    LEBEDEV, AB
    BEREZHKOVA, GV
    PERSTNEV, PP
    APPEL, F
    MESSERSCHMIDT, U
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 91 (01): : 79 - 87
  • [50] SCANNING ELECTRON ACOUSTIC MICROSCOPY.
    Davies, D.G.
    Scanning Electron Microscopy, 1983, v (pt 3) : 1163 - 1176