CHARACTERIZATION OF AEROSOL ORGANICS BY DIFFUSE REFLECTANCE FT-IR

被引:0
|
作者
GORDON, RJ
TRIVEDI, NJ
SINGH, BP
ELLIS, EC
机构
[1] GLOBAL GEOCHEM CORP,CANOGA PK,CA 91303
[2] SO CALIF EDISON CO,ROSEMEAD,CA 91770
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:145 / ENVR
相关论文
共 50 条
  • [21] FT-IR Diffuse Reflectance Sampling with an Environmental Chamber for In Situ Reaction Monitoring
    Briggs, J. L.
    SPECTROSCOPY, 2011, : 20 - 20
  • [22] MATRIX MATERIALS FOR POLAR-SOLVENTS AND DIFFUSE REFLECTANCE FT-IR SPECTROSCOPY
    BRACKETT, JM
    AZARRAGA, LV
    ROGERS, LB
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1983, 186 (AUG): : 161 - ANYL
  • [23] Characterization of aerosol organics by diffuse reflectance Fourier transform infrared spectroscopy
    Gordon, R.J.
    Trivedi, N.J.
    Singh, B.P.
    Ellis, E.C.
    Environmental Science and Technology, 1988, 22 (06): : 672 - 677
  • [24] Characterization of cotton and treated cotton by FT-IR and FT-IR microspectroscopy
    Morris, NM
    Catalano, EA
    Morris, CE
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 213 : 45 - CELL
  • [25] FT-IR DIFFUSE REFLECTANCE STUDY OF THE ADSORPTION AND OXIDATION OF ALCOHOLS ON POROUS SILICA SURFACES
    HORR, TJ
    RALSTON, J
    SMART, RS
    COLLOIDS AND SURFACES, 1992, 63 (1-2): : 21 - 28
  • [26] METHODS FOR QUANTITATIVE DIFFUSE REFLECTANCE FT-IR - ADSORPTION DENSITIES OF ALCOHOLS ON SILICA POWDERS
    HORR, TJ
    RALSTON, J
    SMART, RSC
    COLLOIDS AND SURFACES, 1992, 64 (01): : 67 - 85
  • [27] QUANTITATIVE FT-IR DIFFUSE REFLECTANCE ANALYSIS OF VINYL SILANES ON AN ALUMINUM HYDROXIDE SUBSTRATE
    PORRO, TJ
    PATTACINI, SC
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1992, 6 (01) : 73 - 78
  • [28] DIFFUSE REFLECTANCE FT-IR ANALYSIS OF ROSIN FLUX-METAL OXIDE INTERACTIONS
    SNYDER, RW
    APPLIED SPECTROSCOPY, 1987, 41 (03) : 460 - 463
  • [29] Investigation of chemical interactions at the steel/polymer interface by FT-IR diffuse reflectance spectroscopy
    Bistac, S
    Vallat, MF
    Schultz, J
    APPLIED SPECTROSCOPY, 1997, 51 (12) : 1823 - 1825
  • [30] Characterization of copper surfaces used in electronic circuit boards by reflectance FT-IR
    Sloan, JM
    Pergantis, CG
    NONDESTRUCTIVE METHODS FOR MATERIALS CHARACTERIZATION, 2000, 591 : 289 - 293