SPECTRAL INTERFERENCES IN SECONDARY ION MASS-SPECTROMETRY

被引：21

作者：

COLBY, BN ^{[1
]}

EVANS, CA ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

关键词：

D O I：

10.1366/000370273774333515

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：274 / 279

页数：6

共 50 条

[41] LIQUID MATRICES FOR SECONDARY ION MASS-SPECTROMETRY
DEPAUW, E
MASS SPECTROMETRY REVIEWS, 1986, 5 (02) : 191 - 212
[42] SEMIQUANTITATIVE ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : 285 - 290
[43] BEAM OPTICS IN SECONDARY ION MASS-SPECTROMETRY
LIEBL, H
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 187 (01): : 143 - 151
[44] ISOTOPE FRACTIONATION IN SECONDARY ION MASS-SPECTROMETRY
SHIMIZU, N
HART, SR
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) : 1303 - 1311
[45] SECONDARY ION MASS-SPECTROMETRY IN THE FIELD OF SEMICONDUCTORS
HUBER, A
MORILLOT, G
MERENDA, P
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (04): : 493 - 503
[46] SECONDARY-ION MASS-SPECTROMETRY IMAGING
ODOM, RW
APPLIED SPECTROSCOPY REVIEWS, 1994, 29 (01) : 67 - 116
[47] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF SILICON
GRASSERBAUER, M
STINGEDER, G
VACUUM, 1989, 39 (11-12) : 1077 - 1087
[48] QUANTITATIVE ORGANIC SECONDARY ION MASS-SPECTROMETRY
TODD, PJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1989, 197 : 39 - ANYL
[49] SECONDARY ION MASS-SPECTROMETRY OF CAPE YORK
ENGSTROM, EU
METEORITICS, 1989, 24 (04): : 264 - 264
[50] SECONDARY ION MASS-SPECTROMETRY OF SUGAR NUCLEOTIDES
II, T
OKUDA, S
HIRANO, T
TSUJIMOTO, K
OHASHI, M
ORGANIC MASS SPECTROMETRY, 1993, 28 (02): : 127 - 131