IMPROVED ELECTRON BEAM SCANNING SYSTEM FOR ELECTRON MICROPROBE X-RAY ANALYZERS

被引：1
|
作者：
KNISELEY, RN
LAABS, FC
VANZUUK, D
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1968年 / 39卷 / 12期
关键词：
D O I：
10.1063/1.1683243
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1804 / &
相关论文
共 50 条
  • [21] A SCANNING ELECTRON MICROSCOPE AND X-RAY MICROANALYZER
    FETISOV, DV
    KUSHNIR, YM
    DITSMAN, SA
    DERSHVAR.GV
    POSTNIKO.EB
    POCHTARE.BI
    RASPLETI.KK
    YURCHENK.GY
    BEZLEPKI.SV
    SAMOILOV, AI
    STEPANOV, SS
    GUROVA, RP
    SPEKTOR, FU
    PARSHINA, OK
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1968, 32 (06): : 942 - &
  • [22] Development of Scanning Electron and X-ray Microscope
    Matsumura, Tomokazu
    Hirano, Tomohiko
    Suyama, Motohiro
    XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2016, 1696
  • [23] ELECTRON X-RAY RATIOS IN AN ELECTRON-BEAM EVAPORATOR
    BHATTACHARYA, PK
    REISMAN, A
    CHEN, MC
    JOURNAL OF ELECTRONIC MATERIALS, 1987, 16 (04) : A12 - A13
  • [24] CALCIUM IN MYONUCLEI - ELECTRON-MICROPROBE X-RAY ANALYSIS
    YAROM, R
    HALL, TA
    PETERS, PD
    EXPERIENTIA, 1975, 31 (02): : 154 - 157
  • [25] MINERALOGICAL MODAL ANALYSIS WITH ELECTRON MICROPROBE X-RAY ANALYZER
    KEIL, K
    AMERICAN MINERALOGIST, 1965, 50 (11-1) : 2089 - &
  • [26] ELECTRON BEAM AND FLASH X-RAY DIAGNOSTICS
    WALKER, JV
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1970, NS17 (06) : 284 - &
  • [27] The scanning X-ray microprobe at the ESRF "x-ray microscopy" beamline
    Susini, J
    Salomé, M
    Fayard, B
    Ortega, R
    Kaulich, B
    SURFACE REVIEW AND LETTERS, 2002, 9 (01) : 203 - 211
  • [28] X-ray Imaging Using an Electron Beam
    Neo, Yoichiro
    Suzuki, Ryuji
    Aoki, Toru
    Mmimura, Hidenori
    IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, 2012, 19 : 1773 - 1776
  • [29] Improved accuracy in simulation of electron and x-ray beams in external beam radiotherapy
    Faddegon, B.
    Sawkey, D.
    Chen, J.
    Schreiber, E.
    2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11, 2007, : 2568 - +
  • [30] MATERIAL ANALYSIS WITH SCANNING ELECTRON-MICROSCOPE, PHOTOEMISSION MICROSCOPY AND ELECTRON-BEAM X-RAY MICROANALYZER
    BLASCHKE, R
    MIKROSKOPIE, 1972, 27 (11-1) : 349 - &
12345