HIGH-ENERGY RESOLUTION AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES

被引:26
作者
BASSETT, PJ
GALLON, TE
PRUTTON, M
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 10期
关键词
D O I
10.1088/0022-3735/5/10/024
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1008 / &
相关论文
共 14 条
[11]   NEW PHOTOELECTRON SPECTROMETER - COMBINATION OF CYLINDRICAL MIRROR ANALYZER WITH SOFT X-RAY SOURCE [J].
MAEDA, K ;
IHARA, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (10) :1480-&
[12]   HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER [J].
PALMBERG, PW ;
BOHN, GK ;
TRACY, JC .
APPLIED PHYSICS LETTERS, 1969, 15 (08) :254-&
[13]   HIGH RESOLUTION LOW ENERGY ELECTRON SPECTROMETER [J].
SIMPSON, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (12) :1698-&
[14]  
WOLLNIK H, 1967, FOCUSSING CHARGED PA, V2, P174