SHORT-WAVELENGTH ANISOTROPY MEASUREMENTS

被引：0
|
作者：
KREYSA, E
BIERMANN, P
CHINI, R
GEMUND, HP
HALLER, EE
HASLAM, G
LEMKE, R
SIEVERS, A
机构：
[1] IRAM,GRANADA,SPAIN
[2] LBL,BERKELEY,CA
来源：
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES | 1993年 / 688卷
关键词：
D O I：
10.1111/j.1749-6632.1993.tb43987.x
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
[No abstract available]
引用
收藏
页码：839 / 841
页数：3
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