共 50 条
- [27] Dual tunneling-unit scanning tunneling microscope for practical length measurement based on reference scales JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06): : 2684 - 2687
- [28] Dual unit scanning tunneling microscope atomic force microscope for length measurement based on reference scales JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04): : 780 - 784