ANNEALING BEHAVIOR OF NEUTRON-IRRADIATED SILICON-CARBIDE TEMPERATURE MONITORS

被引：43

|

作者：

PRICE, RJ

机构：

来源：

NUCLEAR TECHNOLOGY | 1972年 / 16卷 / 03期

关键词：

D O I：

10.13182/NT72-A31222

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

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页码：536 / &

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