ELLIPSOMETRIC MEASUREMENTS ON THERMALLY EVAPORATED THIN-FILMS

被引:0
|
作者
HILTON, JW [1 ]
HILTON, WA [1 ]
机构
[1] WILLIAM JEWELL COLL,DEPT PHYS,LIBERTY,MO 64068
关键词
D O I
10.1119/1.1987333
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
引用
收藏
页码:702 / 705
页数:4
相关论文
共 50 条
  • [41] ABSORPTION BISTABILITY AND NONLINEARITY IN EVAPORATED THIN-FILMS
    EICHLER, HJ
    HAASE, A
    JANIAK, K
    KUMMROW, A
    WAHI, A
    WAPPELT, A
    OPTICS COMMUNICATIONS, 1992, 88 (4-6) : 298 - 304
  • [42] HALL MEASUREMENTS ON THERMALLY EVAPORATED PbSe MULTILAYER THIN FILMS AND EFFECT OF SUBSTRATE TEMPERATURE
    Arivazhagan, V.
    Rajesh, S.
    CHALCOGENIDE LETTERS, 2010, 7 (09): : 547 - 551
  • [43] DENSITY MEASUREMENTS OF THIN EVAPORATED FILMS
    EBEL, H
    WAGENDRI.A
    JUDTMANN, H
    ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1968, A 23 (11): : 1863 - &
  • [44] Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films
    Hassan, AK
    Gould, RD
    Ray, AK
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1996, 158 (02): : K23 - K25
  • [45] ELLIPSOMETRIC STUDY OF SPRAY PYROLYZED CDS THIN-FILMS
    NOLLY, J
    ABDULLAH, KK
    VIJAYAKUMAR, KP
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1987, 101 (01): : K35 - K38
  • [46] ELLIPSOMETRIC STUDY OF DIAMOND-LIKE THIN-FILMS
    PASCUAL, E
    SERRA, C
    ESTEVE, J
    BERTRAN, E
    SURFACE & COATINGS TECHNOLOGY, 1991, 47 (1-3): : 263 - 268
  • [47] HALL-EFFECT MEASUREMENTS ON FLASH EVAPORATED CADMIUM-SULFIDE THIN-FILMS
    SZALMASSY, Z
    WILMES, L
    VACUUM, 1979, 29 (02) : 83 - 84
  • [48] ELLIPSOMETRIC MEASUREMENT OF THIN SILICON FILMS ON EVAPORATED ALUMINUM-COPPER
    MAGILL, PJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (01): : 122 - 124
  • [49] STRUCTURAL CHARACTERIZATION OF THERMALLY EVAPORATED CdSe THIN FILMS
    Sarmah, K.
    Sarma, R.
    Das, H. L.
    CHALCOGENIDE LETTERS, 2008, 5 (08): : 153 - 163
  • [50] Investigation of thermally evaporated nanocrystalline thin cobalt films
    W. Kozłowski
    J. Balcerski
    P. J. Kowalczyk
    M. Cichomski
    W. Szmaja
    Applied Physics A, 2017, 123