FAULT-TOLERANT SYSTEM USING 3-VALUE LOGIC-CIRCUITS

被引：3

作者：

MOU, H ^{[1
]}

MOUFTAH, HT ^{[1
]}

机构：

[1] QUEENS UNIV,DEPT ELECT ENGN,KINGSTON K7L 3N6,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1109/TR.1987.5222349

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：227 / 231

页数：5

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