EFFECTS OF OXYGEN ADDITION ON DIAMOND FILM GROWTH BY ELECTRON-CYCLOTRON-RESONANCE MICROWAVE PLASMA CVD APPARATUS

被引:31
|
作者
NUNOTANI, M
KOMORI, M
YAMASAWA, M
FUJIWARA, Y
SAKUTA, K
KOBAYASHI, T
NAKASHIMA, S
MINOMO, S
TANIGUCHI, M
SUGIYO, M
机构
[1] DAIHEN CORP, YODOGAWA KU, OSAKA 532, JAPAN
[2] OSAKA UNIV, FAC ENGN, SUITA, OSAKA 565, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1991年 / 30卷 / 7A期
关键词
DIAMOND THIN FILM; ECR PLASMA CVD; CATHODE LUMINESCENCE; SURFACE MORPHOLOGY;
D O I
10.1143/JJAP.30.L1199
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diamond thin films have been grown by an electron-cyclotron-resonance (ECR) microwave plasma chemical vapor deposition (CVD) apparatus under the addition of oxygen to the host ambient gas of a mixture of CO and H-2 gas. Although the amount of oxygen was very minute (0-6% vol. fraction), significant changes due to the oxygen were brought about in the growth properties and the film crystallinity. The Raman spectroscopy revealed a dramatically improved film crystallinity and the film was dominated by the grain growth, resulting in the faceted morphology. With increase in the oxygen up to 4.55%, the visible cathodeluminescence (CL) intensity grew by more than ten times. However, the CL spectrum indicated an appearance of one or two extra recombination centers depending on the amount of oxygen.
引用
收藏
页码:L1199 / L1202
页数:4
相关论文
共 50 条
  • [21] CHARGE SEPARATION IN AN ELECTRON-CYCLOTRON-RESONANCE PLASMA
    INOUE, M
    NAKAMURA, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1995, 13 (02): : 327 - 331
  • [22] ROLE OF OXYGEN IN THE ELECTRON-CYCLOTRON-RESONANCE PLASMA-ASSISTED CHEMICAL-VAPOR-DEPOSITION OF DIAMOND FILMS
    YOUCHISON, DL
    EDDY, CR
    SARTWELL, BD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1993, 11 (04): : 1875 - 1880
  • [23] A STUDY OF DENSITY IN ELECTRON-CYCLOTRON-RESONANCE PLASMA
    UHM, HS
    LEE, PH
    KIM, YI
    KIM, JH
    CHANG, HY
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 1995, 23 (04) : 628 - 635
  • [24] MOTION OF IONS IN AN ELECTRON-CYCLOTRON-RESONANCE PLASMA
    KOHLER, WE
    ROMHELD, M
    SEEBOCK, RJ
    APPLIED PHYSICS LETTERS, 1993, 63 (21) : 2890 - 2892
  • [25] CHARACTERIZATION OF THIN SIN FILM FORMED WITH ELECTRON-CYCLOTRON-RESONANCE NITROGEN PLASMA
    MACHIDA, K
    HOSOYA, T
    IMAI, K
    ARAI, E
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03): : 876 - 880
  • [26] EFFECTS OF SUBSTRATE BIAS FREQUENCY IN AN ELECTRON-CYCLOTRON-RESONANCE PLASMA REACTOR
    CAUGHMAN, JBO
    HOLBER, WM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (06): : 2897 - 2902
  • [27] EFFECTS OF DOWNSTREAM MAGNETIC-FIELD COLLIMATION ON ION BEHAVIOR IN ELECTRON-CYCLOTRON-RESONANCE MICROWAVE PLASMA
    OKUNO, Y
    OHTSU, Y
    FUJITA, H
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 1994, 22 (03) : 253 - 259
  • [28] ION ENERGY ANALYSIS FOR SPUTTERING-TYPE ELECTRON-CYCLOTRON-RESONANCE MICROWAVE PLASMA
    MATSUOKA, M
    ONO, K
    JOURNAL OF APPLIED PHYSICS, 1988, 64 (10) : 5179 - 5182
  • [29] SIGE PMOSFETS WITH GATE OXIDE FABRICATED BY MICROWAVE ELECTRON-CYCLOTRON-RESONANCE PLASMA PROCESSING
    LI, PW
    YANG, ES
    YANG, YF
    CHU, JO
    MEYERSON, BS
    IEEE ELECTRON DEVICE LETTERS, 1994, 15 (10) : 402 - 405
  • [30] RAY-TRACING IN AN ELECTRON-CYCLOTRON-RESONANCE PLASMA
    PARK, HB
    CHOI, NH
    YOON, NS
    CHANG, CS
    CHOI, DI
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1995, 28 (02) : 221 - 224