EFFECTS OF MICROSTRUCTURES ON MICROWAVE PROPERTIES IN Y-BA-CU-O MICROSTRIP RESONATORS

被引：8

作者：

YOSHITAKE, T ^{[1
]}

TSUGE, H ^{[1
]}

INUI, T ^{[1
]}

机构：

[1] NEC CORP LTD,RESOURCES & ENVIRONM PROTECT RES LABS,MIYAMAE KU,KAWASAKI,KANAGAWA 216,JAPAN

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1109/77.403115

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We examined the microwave properties of YBa2Cu3Ox films with different microstructures at 5.7GHz using a microstrip resonator technique. The films were prepared with several types of substrate temperature profiles. Films with small grains (similar to 100nm) and larger critical current density show fairly small rf magnetic field dependence of surface resistance and resonance frequency up to about 50Oe. On the other hand, films with large grains (similar to 200nm) and smaller critical current density show significant changes in these properties. These results suggest that the coupling strength at the grain boundaries mainly dominates the power handling capability, according to a qualitative explanation based on the coupled-grain model.

引用

页码：2571 / 2574

页数：4

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