THE APPLICATION OF A MICROCOMPUTER-CONTROLLED TEMPERATURE DEVICE IN AN AUTOMATED X-RAY DIFFRACTOMETER

被引：0

作者：

GERNAT, C ^{[1
]}

KROBER, R ^{[1
]}

REUTHER, F ^{[1
]}

WESSEL, R ^{[1
]}

DAMASCHUN, G ^{[1
]}

机构：

[1] CENT INST NUTR,POTSDAM,GER DEM REP

来源：

STUDIA BIOPHYSICA | 1986年 / 112卷 / 2-3期

关键词：

D O I：

暂无

中图分类号：

Q6 [生物物理学];

学科分类号：

071011 ;

摘要：

引用

页码：263 / 269

页数：7

共 50 条

[21] LOW-TEMPERATURE ATTACHMENT TO X-RAY DIFFRACTOMETER
PEROV, AP
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1984, 27 (03) : 776 - 777
[22] LOW-TEMPERATURE CAMERA FOR X-RAY DIFFRACTOMETER
JETTER, LK
MCHARGUE, CJ
WILLIAMS, RO
YAKEL, HL
REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (12): : 1087 - 1088
[23] NEW TYPE OF HIGH TEMPERATURE X-RAY DIFFRACTOMETER
SHIMURA, Y
REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (12): : 1404 - &
[24] HIGH-TEMPERATURE FURNACE FOR AN X-RAY DIFFRACTOMETER
PELJO, E
PAAKKARI, T
VIKBERG, P
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (03): : 174 - 176
[25] HIGH-TEMPERATURE ADAPTER FOR AN X-RAY DIFFRACTOMETER
KOCHERZHINSKII, YA
PETKOV, VV
PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (01): : 191 - +
[26] HIGH-TEMPERATURE ATTACHMENT FOR AN X-RAY DIFFRACTOMETER
PETKOV, VV
EPIFANOV, VG
TARNAVSKII, AN
POLENUR, AV
INDUSTRIAL LABORATORY, 1977, 43 (11): : 1573 - 1575
[27] MICROCOMPUTER-CONTROLLED PHOTOMETRIC ANALYZER - APPLICATION TO THE DETERMINATION OF LIDOCAINE
ANDERSSON, L
GRANELI, A
STRANDBERG, M
ANALYTICA CHIMICA ACTA-COMPUTER TECHNIQUES AND OPTIMIZATION, 1978, 2 (04): : 489 - 494
[28] Microcomputer controlled system for X-ray developing machine
Wang, Lisheng
Dianqi Zidonghua/Electrical Automation, 19 (05): : 26 - 28
[29] OAK RIDGE COMPUTER-CONTROLLED X-RAY DIFFRACTOMETER
BUSING, WR
ACTA CRYSTALLOGRAPHICA, 1966, S 21 : A215 - &
[30] ADJUSTING AN X-RAY DIFFRACTOMETER
BONDARS, BY
INDUSTRIAL LABORATORY, 1989, 55 (10): : 1151 - 1152