SECONDARY-ELECTRON MICROSCOPE WITH NEW FEATURES

被引：0
|
作者：
IWANAGA, M [1 ]
DATE, G [1 ]
WAKABAYA.T [1 ]
机构：
[1] SHIMADZU SEISAKUSHO LTD,KYOTO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：284 / 285
页数：2
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