BAYESIAN-APPROACH TO PREDICTION WITH OUTLIERS FROM THE BURR TYPE-X MODEL

被引：2

作者：

JAHEEN, ZF

机构：

[1] Department of Mathematics, University of Assiut, Assiut

来源：

MICROELECTRONICS AND RELIABILITY | 1995年 / 35卷 / 04期

关键词：

D O I：

10.1016/0026-2714(94)00076-Z

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, Bayesian prediction bounds are obtained for the future observations from the Burr type X distribution in the presence of outliers. Numerical examples are used to illustrate the procedure.

引用

页码：703 / 705

页数：3

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