X-RAY-DIFFRACTION INVESTIGATIONS ON ULTRA-THIN GOLD-FILMS

被引：15
|
作者：
HAUPL, K [1 ]
LANG, M [1 ]
WISSMANN, P [1 ]
机构：
[1] UNIV ERLANGEN NURNBERG,INST PHYS & THEORET CHEM,EGERLANDSTR 3,D-8520 ERLANGEN,FED REP GER
来源：
SURFACE AND INTERFACE ANALYSIS | 1986年 / 9卷 / 1-6期
关键词：
LEED/AUGER TECHNIQUES - TEXTURE ANALYSIS - ULTRA-THIN GOLD FILMS - X-RAY DIFFRACTION;
D O I：
10.1002/sia.740090106
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：27 / 30
页数：4
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