SINK STRENGTHS FOR THIN-FILM SURFACES AND GRAIN-BOUNDARIES

被引:132
|
作者
BULLOUGH, R
HAYNS, MR
WOOD, MH
机构
关键词
D O I
10.1016/0022-3115(80)90244-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:44 / 59
页数:16
相关论文
共 50 条
  • [31] GRAIN-BOUNDARIES AND THEIR SIGNIFICANCE
    SCHUCKHER, F
    JKA-JERNKONTORETS ANNALER, 1978, 162 (05): : 36 - 38
  • [32] CLASSIFICATION OF GRAIN-BOUNDARIES
    DARINSKII, BM
    FEDOROV, YA
    FIZIKA TVERDOGO TELA, 1992, 34 (07): : 2053 - 2058
  • [34] Charged Grain Boundaries and Carrier Recombination in Polycrystalline Thin-Film Solar Cells
    Gaury, Benoit
    Haney, Paul M.
    PHYSICAL REVIEW APPLIED, 2017, 8 (05):
  • [35] Grain boundaries in Thin-Film Polycrystalline GaAs Solar Cells: A Simulation Study
    Kumari, Khushboo
    Avasthi, Sushobhan
    2017 IEEE 44TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2017, : 251 - 254
  • [36] Long Lifetime Hole Traps at Grain Boundaries in CdTe Thin-Film Photovoltaics
    Mendis, B. G.
    Gachet, D.
    Major, J. D.
    Durose, K.
    PHYSICAL REVIEW LETTERS, 2015, 115 (21)
  • [37] Variation of the Lifetime of Interconnections Due to the Crystallinity of Grain Boundaries in Thin-Film Interconnections
    Mizuno, Ryota
    Nakoshi, Yutaro
    Suzuki, Ken
    Miura, Hideo
    2018 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING (EMAP), 2018,
  • [38] GRAIN-BOUNDARIES - COMMENT
    KIRCHNER, HOK
    REVUE DE PHYSIQUE APPLIQUEE, 1988, 23 (04): : 475 - 478
  • [39] OBSERVATION OF GRAIN-BOUNDARIES
    GOUX, C
    JOURNAL OF MICROSCOPY, 1974, 102 (DEC) : 241 - 260
  • [40] IMPURITIES AT GRAIN-BOUNDARIES
    KAZMERSKI, LL
    IRELAND, PJ
    CISZEK, TF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : C110 - C111