NEW ETCHING PATTERN OF QUARTZ AND ITS USES FOR THE DETERMINATION OF ELECTRIC AXES AND THE DETECTION OF CRYSTALLINE DEFECTS

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作者：
CHOONG, SP
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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1945年 / 35卷 / 08期
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O4 [物理学];
学科分类号：
0702 ;
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页码：552 / 558
页数：7
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