NEW ETCHING PATTERN OF QUARTZ AND ITS USES FOR THE DETERMINATION OF ELECTRIC AXES AND THE DETECTION OF CRYSTALLINE DEFECTS

被引：0

|

作者：

CHOONG, SP

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1945年 / 35卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：552 / 558

页数：7

相关论文

共 50 条

[1] DEVELOPMENT OF DEFECTS IN QUARTZ BY METHODS OF ETCHING AND DECORATION WITH SILVER IN AN ELECTRIC FIELD
TSINZERLING, EV
VOLSKAYA, OB
SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1969, 13 (06): : 904 - +
[2] NEW METHODS FOR DETECTING CERTAIN CRYSTALLINE DEFECTS IN QUARTZ
CHOONG, SP
AMERICAN MINERALOGIST, 1952, 37 (9-10) : 791 - 803
[3] CRYSTALLINE AXES OF THE SPINE AND TEST OF THE SEA-URCHIN STRONGYLOCENTROTUS-PURPURATUS - DETERMINATION BY CRYSTAL ETCHING AND DECORATION
OKAZAKI, K
DILLAMAN, RM
WILBUR, KM
BIOLOGICAL BULLETIN, 1981, 161 (03): : 402 - 415
[4] ETCHING BEHAVIOR OF FISSION FRAGMENT TRACKS IN SYNTHETIC QUARTZ AND ITS APPLICATION TO NEUTRON DETECTION
SAWAMURA, T
BABA, S
NARITA, M
YAMAZAKI, H
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 1994, 31 (04) : 257 - 263
[5] A REVIEW OF ELECTRON-SPIN SPECTROSCOPY AND ITS APPLICATION TO THE STUDY OF PARAMAGNETIC DEFECTS IN CRYSTALLINE QUARTZ
WEIL, JA
PHYSICS AND CHEMISTRY OF MINERALS, 1984, 10 (04) : 149 - 165
[6] DETERMINATION OF ELECTRIC PROPERTIES OF ROCK IN ITS NATURAL STATE IN CRYSTALLINE BASEMENT
NIKITINA, VN
ENENSHTE.BS
GEOPHYSICS, 1969, 34 (06) : 1020 - &
[7] The use of a new technology for enhanced detection of crystalline defects on silicon wafers
Dou, L
Kesler, D
Grose, R
FLATNESS, ROUGHNESS, AND DISCRETE DEFECTS CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS II, 1998, 3275 : 138 - 144
[8] NEW METHOD FOR DETERMINATION OF FREQUENCY-SPECTRUM OF A QUARTZ CRYSTAL AND ITS APPLICATIONS
BAHADUR, H
PARSHAD, R
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1978, 25 (01): : 24 - 29
[9] A new detection technique of crystalline defects by sheet resistance measurement on multicrystalline silicon wafers
Fathi, M
Bouhafs, D
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 21 (04) : 437 - 442
[10] AIS hypermutation algorithm based pattern recognition and its application in ultrasonic defects detection
Liu, JZ
Wang, B
2005 INTERNATIONAL CONFERENCE ON CONTROL AND AUTOMATION (ICCA), VOLS 1 AND 2, 2005, : 1268 - 1272

← 1 2 3 4 5 →