ELECTRONIC STACKING-FAULT STATES IN SILICON

被引：0

|

作者：

PATEL, JR ^{[1
]}

MATTHEISS, LF ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1981年 / 26卷 / 03期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

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页码：288 / 288

页数：1

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