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SYNCHROTRON RADIATION AS A SOURCE FOR QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY - ADVANTAGES AND CONSEQUENCES
被引:5
|
作者
:
ROSSEEL, TM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
ROSSEEL, TM
CARLSON, TA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
CARLSON, TA
NEGRI, RE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
NEGRI, RE
BEALL, CE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
BEALL, CE
TAYLOR, JW
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
TAYLOR, JW
机构
:
[1]
UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
[2]
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
|
1987年
/ 5卷
/ 04期
关键词
:
D O I
:
10.1116/1.574780
中图分类号
:
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
引用
收藏
页码:1241 / 1242
页数:2
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