SCANNING NEAR-FIELD ACOUSTIC MICROSCOPY

被引：131
|
作者：
GUNTHER, P [1 ]
FISCHER, U [1 ]
DRANSFELD, K [1 ]
机构：
[1] ERNST LEITZ WETZLAR GMBH,D-6330 WETZLAR,FED REP GER
来源：
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY | 1989年 / 48卷 / 01期
关键词：
D O I：
10.1007/BF00694423
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：89 / 92
页数：4
相关论文
共 50 条
  • [41] Resolution in scanning near-field cathodoluminescence microscopy
    Pastré, D
    Bubendorff, JL
    Troyon, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03): : 1138 - 1143
  • [42] Contactless topography and microhardness measurements using scanning near-field acoustic microscopy (SNAM)
    Goch, G
    Lehmann, P
    PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 479 - 482
  • [43] Field enhancement in apertureless near-field scanning optical microscopy
    Bohn, JL
    Nesbitt, DJ
    Gallagher, A
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (12): : 2998 - 3006
  • [44] Detection of optical field by near-field scanning optical microscopy
    Xu, TJ
    Xu, JY
    Wang, J
    Pan, D
    Sun, LQ
    Tian, Q
    ADVANCED OPTICAL STORAGE TECHNOLOGY, 2002, 4930 : 195 - 198
  • [45] Field-enhanced scanning near-field optical microscopy
    Bouhelier, Alexandre
    MICROSCOPY RESEARCH AND TECHNIQUE, 2006, 69 (07) : 563 - 579
  • [46] Scanning near-field acoustic microscope and its application
    Ping Xu
    Wei Cai
    RongMing Wang
    Science China Technological Sciences, 2011, 54 : 126 - 130
  • [47] Scanning near-field fluorescence microscopy of conjugated polymers
    Stevenson, R
    Granström, M
    Richards, D
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1999, 215 (01): : 65 - 69
  • [48] Video rate near-field scanning optical microscopy
    Bukofsky, SJ
    Grober, RD
    APPLIED PHYSICS LETTERS, 1997, 71 (19) : 2749 - 2751
  • [49] Surface plasmon scanning near-field optical microscopy
    Kryukov, AE
    Kim, YK
    Ketterson, JB
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (11) : 5411 - 5415
  • [50] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION
    FISCHER, UC
    DURIG, UT
    POHL, DW
    APPLIED PHYSICS LETTERS, 1988, 52 (04) : 249 - 251
12345