SCANNING NEAR-FIELD ACOUSTIC MICROSCOPY

被引:131
|
作者
GUNTHER, P [1 ]
FISCHER, U [1 ]
DRANSFELD, K [1 ]
机构
[1] ERNST LEITZ WETZLAR GMBH,D-6330 WETZLAR,FED REP GER
来源
关键词
D O I
10.1007/BF00694423
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:89 / 92
页数:4
相关论文
共 50 条
  • [1] NEAR-FIELD SCANNING ACOUSTIC MICROSCOPE
    KHURIYAKUB, BT
    CINBIS, C
    CHOU, CH
    REINHOLDTSEN, PA
    IEEE 1989 ULTRASONICS SYMPOSIUM : PROCEEDINGS, VOLS 1 AND 2, 1989, : 805 - 807
  • [2] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    MORRISON, GH
    ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
  • [3] Scanning near-field cathodoluminescence microscopy
    Troyon, M
    Pastre, D
    Jouart, JP
    Beaudoin, JL
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 453 - 454
  • [4] SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SCANNING THERMAL MICROSCOPY
    PYLKKI, RJ
    MOYER, PJ
    WEST, PE
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3785 - 3790
  • [5] Scanning near-field optical microscopy and scanning thermal microscopy
    Pylkki, Russell J., 1600, JJAP, Minato-ku, Japan (33):
  • [6] Near-field scanning - Optical microscopy
    Shiku, H
    Dunn, RC
    ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
  • [7] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    HEINZELMANN, H
    POHL, DW
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
  • [8] Scanning near-field cathodoluminescence microscopy
    Troyon, M
    Pastré, D
    Jouart, JP
    Beaudoin, JL
    ULTRAMICROSCOPY, 1998, 75 (01) : 15 - 21
  • [9] Scanning near-field infrared microscopy
    Tom Vincent
    Nature Reviews Physics, 2021, 3 : 537 - 537
  • [10] NEAR-FIELD SCANNING NANOPHOTONIC MICROSCOPY
    Zhang, John X. J.
    Hoshino, Kazunori
    Gopal, Ashwini
    2008 IEEE/LEOS INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS, 2008, : 180 - 181