MEASUREMENT TECHNIQUES FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS

被引：0

作者：

LUCYSZYN, S ^{[1
]}

STEWART, C ^{[1
]}

ROBERTSON, ID ^{[1
]}

AGHVAMI, AH ^{[1
]}

机构：

[1] CASCADE MICROTECH EUROPE,BANBURY OX15 4QY,OXON,ENGLAND

来源：

ELECTRONICS & COMMUNICATION ENGINEERING JOURNAL | 1994年 / 6卷 / 02期

关键词：

D O I：

10.1049/ecej:19940204

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper introduces the basic technologies that are associated with measurements of monolithic microwave integrated circuits. The use of test fixtures and wafer probe stations at ambient room temperature is reviewed and their role at thermal and cryogenic temperatures is discussed. With the increasing need for performing non-invasive measurements, advances in experimental field probing techniques are explored.

引用

页码：69 / 76

页数：8

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