ELECTRONIC AND STRUCTURAL-PROPERTIES OF THE CU-BI2CASR2CU2O8 INTERFACE

被引：5

作者：

BERNHOFF, H ^{[1
]}

QVARFORD, M ^{[1
]}

SODERHOLM, S ^{[1
]}

FLODSTROM, AS ^{[1
]}

ANDERSEN, JN ^{[1
]}

NYHOLM, R ^{[1
]}

KARLSSON, UO ^{[1
]}

LINDAU, I ^{[1
]}

机构：

[1] UNIV LUND,MAXLAB,S-22100 LUND,SWEDEN

来源：

PHYSICA C | 1991年 / 180卷 / 1-4期

关键词：

D O I：

10.1016/0921-4534(91)90649-J

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The formation of the Cu-Bi2CaSr2Cu2O8 interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20-1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the core-level shifts. A strong chemical reaction between Bi2CaSr2CuO8 and Cu is manifested by the formation of metallic Bi. From the intensity variations as a function of electron emission angle it is shown that the metallic Bi segregates to the top surface layer.

引用

页码：120 / 123

页数：4

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