COLORING IMAGE BY HITACHI SEM

被引:0
|
作者
GOTOH, M
YAMADA, M
NAGATANI, T
YAMADA, O
机构
[1] HITACHI INSTRUMENT ENGN CO LTD,TECHNO RES LAB,KATSUTA 312,JAPAN
[2] HITACHI LTD,NAKA WORKS,KATSUTA 312,JAPAN
来源
JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 04期
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:317 / 317
页数:1
相关论文
共 50 条
  • [41] Image distortions in SEM and their influences on EBSD measurements
    Nolze, Gert
    ULTRAMICROSCOPY, 2007, 107 (2-3) : 172 - 183
  • [42] Design of image scanning system based on SEM
    Ren, Sheng-Xian
    Fang, Guang-Rong
    Weixi Jiagong Jishu/Microfabrication Technology, 2007, (02): : 1 - 4
  • [43] FULLY AUTOMATED SEM IMAGE-ANALYSIS
    EDWARDS, RM
    LEBIEDZIK, J
    STONE, G
    SCANNING, 1986, 8 (05) : 221 - 231
  • [44] Overlay excursion monitoring using SEM image
    Yeo, JH
    Yang, KM
    Kim, JS
    Kang, YS
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVI, PTS 1 & 2, 2002, 4689 : 869 - 875
  • [45] PolishEM: image enhancement in FIB-SEM
    Fernandez, Jose-Jesus
    Torres, Teobaldo E.
    Martin-Solana, Eva
    Goya, Gerardo F.
    Fernandez-Fernandez, Maria-Rosario
    BIOINFORMATICS, 2020, 36 (12) : 3947 - 3948
  • [46] A fast super resolution algorithm for SEM image
    Liu Hengshu
    Wang Xinwei
    INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2007: IMAGE PROCESSING, 2008, 6623
  • [47] SEM IMAGE OF THE CHORIONIC PLATE AT FULL TERM
    AGORASTOS, T
    ECONOMOUAMILLI, A
    PAPALOUKAS, A
    ACTA ANATOMICA, 1984, 120 (1-2): : 4 - 4
  • [48] DIGITAL IMAGE PROCESSING SYSTEM FOR SEM & EPMA
    Hu Wengou Wu Yongchiang Lin Lizhong and Chen ErgangPhysics Department Yunnan University Kunming China
    电子显微学报, 1991, (02) : 221 - 221
  • [49] Parallel Edge Detection of Image Processing on SEM
    Ahmed, Hafiz Shehzad
    Zhao, Hongdong
    Yao, Yiyang
    Hussain, Munawar
    VISION 2020: SUSTAINABLE ECONOMIC DEVELOPMENT AND APPLICATION OF INNOVATION MANAGEMENT, 2018, : 562 - 568
  • [50] EFFECTS OF SE DETECTOR POSITION ON SEM IMAGE
    KAWAMOTO, H
    YAMAZAKI, S
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 252 - 252