INVESTIGATION OF VALIDITY OF RECIPROCITY LAW FOR HIGH-INTENSITY X-RAY EXPOSURES

被引：0
|
作者：
ARMISTEAD, RA [1 ]
机构：
[1] STANFORD RES INST,RADIAT PHYS,MENLO PK,CA 94025
来源：
PHOTOGRAPHIC SCIENCE AND ENGINEERING | 1975年 / 19卷 / 03期
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中图分类号：
TB8 [摄影技术];
学科分类号：
0804 ;
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页码：167 / 170
页数：4
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