ION INDUCED SECONDARY-ELECTRON EMISSION AS A PROBE FOR ADSORBED OXYGEN ON TUNGSTEN

被引：12
|
作者：
HASSELKAMP, D
SCHARMANN, A
STILLER, N
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(80)91313-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：579 / 583
页数：5
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