APPROACH TO BUILT-IN TESTING

被引：4
|
作者：
SAEKS, R
机构：
来源：
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS | 1978年 / 14卷 / 05期
关键词：
D O I：
10.1109/TAES.1978.308633
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：813 / 818
页数：6
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