ESTIMATION OF THE RELIABILITY OF COMPUTER-COMPONENTS FROM FIELD RENEWAL DATA

被引：11

作者：

TRINDADE, DC ^{[1
]}

HAUGH, LD ^{[1
]}

机构：

[1] UNIV VERMONT,BURLINGTON,VT 05405

来源：

MICROELECTRONICS AND RELIABILITY | 1980年 / 20卷 / 03期

关键词：

D O I：

10.1016/0026-2714(80)90202-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：205 / 218

页数：14

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