STUDIES OF CDTE SURFACES WITH SECONDARY ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING AND ELLIPSOMETRY

被引：63
|
作者：
HAGEALI, M
STUCK, R
SAXENA, AN
SIFFERT, P
机构：
来源：
APPLIED PHYSICS | 1979年 / 19卷 / 01期
关键词：
D O I：
10.1007/BF00900533
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：25 / 33
页数：9
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