SEMICONDUCTOR NONDESTRUCTIVE TESTING BY HELICON WAVES

被引：5
|
作者：
LAURINAVICIUS, A
MALAKAUSKAS, P
POZELA, J
机构：
[1] Lithuanian Acad of Sciences, Vilnius, USSR, Lithuanian Acad of Sciences, Vilnius, USSR
来源：
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1987年 / 8卷 / 05期
关键词：
D O I：
10.1007/BF01013265
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
SEMICONDUCTOR MATERIALS
引用
收藏
页码：573 / 582
页数：10
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