LASER-DRIVEN ELECTRON IONIZATION FOR A VUV PHOTOIONIZATION TIME-OF-FLIGHT MASS-SPECTROMETER

被引：26

作者：

BOYLE, JG ^{[1
]}

PFEFFERLE, LD ^{[1
]}

GULCICEK, EE ^{[1
]}

COLSON, SD ^{[1
]}

机构：

[1] YALE UNIV, DEPT CHEM, NEW HAVEN, CT 06510 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 02期

关键词：

D O I：

10.1063/1.1142123

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The modification of a VUV photoionization time-of-flight mass spectrometer (TOF-MS) to accommodate pulsed electron ionization is described. Utilizing a selected wavelength from a UV or VUV laser, structurally important fragment ions can be created for mass analysis. Data are straightforwardly obtained with only minor modifications to the experimental apparatus. The electron energy is continuously adjustable, thereby allowing the extent of fragmentation to be controlled. Observed fragmentation patterns are quantitatively similar to conventional electron ionization. Performance using UV or VUV radiation as the photoelectric driver is adequate to perform pulsed electron ionization on a time scale compatible with TOF-MS.

引用

页码：323 / 333

页数：11

共 50 条

[31] LASER SPECTROSCOPY OF MASS-SELECTED IONS IN A REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER
WILLEY, KF
ROBBINS, DL
YEH, CS
DUNCAN, MA
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 201 : 228 - PHYS
[32] Laser time-of-flight mass spectrometer
Sysoev, AA
Poteshin, SS
Dryannov, AI
Shchekina, IV
Pyatakhin, VI
Menshikov, RA
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1997, 40 (04) : 508 - 512
[33] Design, Construction and Calibration of a Laser Ionization Time-of-Flight Mass Spectrometer
Tabrizchi, M.
Farrokhpour, H.
Abyar, F.
Azad, H.
Mirian, M.
ILbeigi, V.
PHYSICAL CHEMISTRY RESEARCH, 2014, 2 (02): : 202 - 216
[34] A laser ablation electron impact ionization time-of-flight mass spectrometer for analysis of condensed materials
Drewnick, F
Wieser, PH
REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (08): : 3003 - 3006
[35] Laser-induced surface ionization in a time-of-flight mass spectrometer
Schriemer, David C.
Li, Liang
Review of Scientific Instruments, 1995, 66 (1 pt 1):
[36] HIGH-RESOLUTION TIME-OF-FLIGHT MASS-SPECTROMETER
BERGMANN, T
MARTIN, TP
SCHABER, H
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (04): : 792 - 793
[37] QUADRUPOLE-FOCUSING TIME-OF-FLIGHT MASS-SPECTROMETER
WILDE, HR
GONSIOR, B
ROTH, M
UHLHORN, CD
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (12): : 1279 - 1283
[38] A MOLECULAR-BEAM TIME-OF-FLIGHT MASS-SPECTROMETER USING LOW-ENERGY-ELECTRON IMPACT IONIZATION
HAYDEN, CC
PENN, SM
MUYSKENS, KJC
CRIM, FF
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (02): : 775 - 782
[39] A COMPACT TIME-OF-FLIGHT MASS-SPECTROMETER WITH ELECTROSTATIC MIRRORS
WILKEN, B
STUDEMANN, W
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (03): : 587 - 600
[40] A TIME-OF-FLIGHT MASS-SPECTROMETER FOR STATIC SIMS APPLICATIONS
STEFFENS, P
NIEHUIS, E
FRIESE, T
GREIFENDORF, D
BENNINGHOVEN, A
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1322 - 1325

← 1 2 3 4 5 →