EARLY VOLTAGE UNIQUENESS TEST FOR BIPOLAR JUNCTION TRANSISTORS

被引：1
|
作者：
HART, BL
机构：
来源：
ELECTRONICS LETTERS | 1980年 / 16卷 / 18期
关键词：
D O I：
10.1049/el:19800499
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：703 / 705
页数：3
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