COMMENT ON TIME-DEPENDENT METHODOLOGY FOR FAULT TREE EVALUATION

被引：0
|
作者：
MURCHLAND, JD
机构：
来源：
NUCLEAR ENGINEERING AND DESIGN | 1972年 / 22卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：167 / +
页数：1
相关论文
共 50 条
  • [41] Comment on "Solution of the Schrodinger equation for the time-dependent linear potential"
    Bekkar, H
    Benamira, F
    Maamache, M
    PHYSICAL REVIEW A, 2003, 68 (01):
  • [42] Are State- and Time-Dependent Models Really Different? Comment
    Kaplan, Greg
    NBER MACROECONOMICS ANNUAL, 2017, 31 (01) : 465 - 474
  • [43] On challenges in the uncertainty evaluation for time-dependent measurements
    Eichstaedt, S.
    Wilkens, V.
    Dienstfrey, A.
    Hale, P.
    Hughes, B.
    Jarvis, C.
    METROLOGIA, 2016, 53 (04) : S125 - S135
  • [44] Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS)
    Kuyama, Tomohiro
    Urabe, Keiichiro
    Eriguchi, Koji
    2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
  • [45] Performance Evaluation of Probabilistic Time-Dependent Travel Time Computation
    Golasowski, Martin
    Tomis, Radek
    Martinovic, Jan
    Slaninova, Katerina
    Rapant, Lukas
    COMPUTER INFORMATION SYSTEMS AND INDUSTRIAL MANAGEMENT, CISIM 2016, 2016, 9842 : 377 - 388
  • [46] A computerized fault tree construction methodology
    Andrews, JD
    Henry, JJ
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART E-JOURNAL OF PROCESS MECHANICAL ENGINEERING, 1997, 211 (E3) : 171 - 183
  • [47] AN AUTOMATED METHODOLOGY FOR GENERATING A FAULT TREE
    DEVRIES, RC
    IEEE TRANSACTIONS ON RELIABILITY, 1990, 39 (01) : 76 - 86
  • [48] FORMAL METHODOLOGY FOR FAULT TREE CONSTRUCTION
    FUSSELL, JB
    NUCLEAR SCIENCE AND ENGINEERING, 1973, 52 (04) : 421 - 432
  • [49] Methodology for Visualized Fault Tree Analysis
    Su, Xiaoqin
    Lei, Zhaoming
    2011 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL (ICECC), 2011, : 898 - 901
  • [50] A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
    Saraza-Canflanca, P.
    Diaz-Fortuny, J.
    Castro-Lopez, R.
    Roca, E.
    Martin-Martinez, J.
    Rodriguez, R.
    Nafria, M.
    Fernandez, F., V
    INTEGRATION-THE VLSI JOURNAL, 2020, 72 : 13 - 20
12345