SPECIMENS FOR TESTING RESOLUTION OF SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
SPEIDEL, R
BAUER, B
MARTIN, JP
机构：
来源：
OPTIK | 1971年 / 34卷 / 03期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：321 / &
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