PHOTOLUMINESCENCE ABOVE THE TAUC GAP IN A-SI-H

被引:11
|
作者
CAMPBELL, IH [1 ]
FAUCHET, PM [1 ]
LYON, SA [1 ]
NEMANICH, RJ [1 ]
机构
[1] N CAROLINA STATE UNIV,DEPT PHYS,RALEIGH,NC 27695
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 14期
关键词
D O I
10.1103/PhysRevB.41.9871
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the observation of photoluminescence (PL) significantly above the Tauc gap in a-Si:H. The dependence on temperature, incident intensity, excitation energy, deep-defect concentration, and time-resolved measurements are presented. The PL begins at the excitation energy, decreases in intensity as the photon energy decreases, reaches a minimum at 2 eV, and then increases exponentially until it approaches the PL peak at 1.4 eV. The luminescence above 2 eV is weak and temperature independent. It is attributed to the recombination of nonthermal electrons with nonthermal holes. Below 2 eV, the luminescence depends on temperature and deep-defect density. It results from the recombination of electrons and holes in the band tails. At low temperature, the slope of the luminescence indicates that the radius of the electron wave function in the band tail is 10. © 1990 The American Physical Society.
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页码:9871 / 9879
页数:9
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