X-RAY DETERMINATION OF THE THICKNESS OF THIN-FILMS OF TIC, TIN, TI(N,C)

被引：1

|

作者：

NEUMANN, J

HEJDOVA, H

CERMAK, M

机构：

来源：

CZECHOSLOVAK JOURNAL OF PHYSICS | 1989年 / 39卷 / 01期

关键词：

D O I：

10.1007/BF01597438

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：80 / 89

页数：10

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