X-RAY DETERMINATION OF THE THICKNESS OF THIN-FILMS OF TIC, TIN, TI(N,C)

被引：1

|

作者：

NEUMANN, J

HEJDOVA, H

CERMAK, M

机构：

来源：

CZECHOSLOVAK JOURNAL OF PHYSICS | 1989年 / 39卷 / 01期

关键词：

D O I：

10.1007/BF01597438

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：80 / 89

页数：10

相关论文

共 50 条

[1] X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals
Wokulska, K
SOLID STATE CRYSTALS IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY, 1997, 3179 : 176 - 179
[2] THICKNESS MEASUREMENT OF THIN-FILMS BY X-RAY ABSORPTION
CHAUDHURI, J
SHAH, S
JOURNAL OF APPLIED PHYSICS, 1991, 69 (01) : 499 - 501
[3] X-RAY DETERMINATION OF POISSONS RATIO IN THIN-FILMS
BASILE, G
ZOSI, G
MARTINI, G
THIN SOLID FILMS, 1972, 11 (02) : 441 - &
[4] X-RAY DETERMINATION OF DEBYE TEMPERATURE OF GOLD THIN-FILMS
CHURAKOVA, NP
ARINKIN, AV
PUGACHEV, AT
FIZIKA TVERDOGO TELA, 1981, 23 (06): : 1801 - 1802
[5] THIN-FILMS FOR X-RAY ASTRONOMY
WILLIAMSON, F
MAXSON, CW
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (01): : 50 - 52
[6] Determination of the thickness of polycrystalline thin films by using X-ray methods
Danis, S.
Matej, Z.
Matejova, L.
Krupka, M.
THIN SOLID FILMS, 2015, 591 : 215 - 218
[7] CHARACTERIZATION OF THIN-FILMS BY X-RAY DIFFRACTOMETRY
PARRISH, W
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 277 - &
[8] X-RAY TENSILE TESTING OF THIN-FILMS
NOYAN, IC
SHEIKH, G
JOURNAL OF MATERIALS RESEARCH, 1993, 8 (04) : 764 - 770
[9] MULTILAYER THIN-FILMS FOR X-RAY OPTICS
SPILLER, E
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 1709 - 1710
[10] DETERMINATION OF THICKNESS OF MULTIPLE LAYER THIN-FILMS BY AN X-RAY-DIFFRACTION TECHNIQUE
CHAUDHURI, J
HASHMI, F
JOURNAL OF APPLIED PHYSICS, 1994, 76 (07) : 4454 - 4456

← 1 2 3 4 5 →